High-Contrast Chemically Amplified Photodefinable Poly(benzoxazole) Using Dissolution Reversers
نویسندگان
چکیده
منابع مشابه
Dissolution behavior of chemically amplified resist polymers for 248-, 193-, and 157-nm lithography
Dissolution behavior of chemically amplified resist polymers for 248-, 193-, and 157-nm lithography The aqueous base development step is one of the most critical processes in modern lithographic imaging technology. Sinusoidal modulation of the exposing light intensity must be converted to a step function in the resist film during the development process. Thus, in designing high-performance resi...
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Direct waveguide definition of a negative photoresist (SU8) containing tricyanovinylidenediphenylaminobenzene (TCVDPA) as electro-optic (EO) chromophore, has been demonstrated for the first time. This was possible by utilising the chromophore low absorption window in the UV region allowing crosslinking of the host polymer by exposing to UV light followed by thermal curing. TCVDPA was modified b...
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The continuing drive by the semiconductor industry to fabricate smaller structures using photolithography will soon require dimensional control at length scales comparable to the size of the polymeric molecules in the materials used to pattern them. The current technology, chemically amplified photoresists, uses a complex reaction-diffusion process to delineate patterned areas with high spatial...
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As we enter the DUV lithography generation, the developmental phase of the photolithography process is becoming crucial due to the high costs associated with the lithography equipment. Improvements in the modeling of chemically amplified resists are necessary to extract the maximum possible information from the minimum amount of experimentation. The poor man’s dissolution rate monitor (drm) met...
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ژورنال
عنوان ژورنال: Journal of Photopolymer Science and Technology
سال: 2004
ISSN: 0914-9244,1349-6336
DOI: 10.2494/photopolymer.17.247